By Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)
Mathematical innovations in XRay Spectrometry: examine within the Quantitative research of person debris through XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of sunshine components by means of XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS recommendations and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, commercial, and different functions of XRS: software of XRF within the Aluminum (F.R. Feret). XRay Characterization of skinny Films: Grazing prevalence XRay Characterization of fabrics (D.K. Bowen, M. Wormington). WholePattern becoming, section research through Diffraction Methods: part id utilizing WholePattern Matching (D.K. Smith et al.). Polymer functions of XRD. HighTemperature and NonAmbient purposes of XRD. rigidity and pressure choice by means of Diffraction equipment, top Broadening research. XRD suggestions and Instrumentation. seventy one extra articles. Index.
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Extra info for Advances in X-Ray Analysis: Volume 36
Fit coefficients for mass absorption coefficients of Fe and C have been calculated from experimental data collected by Saloman and Hubbel 13 for energies between 100eVand IkeV . INTRODUCTION The established applications of fundamental parameter computations describe the observed photon counts as the sum of primary photons excited by the tube radiation and secondary photons excited by the fluorescent photons from other elements in the sample. Only a few special applications take additional effects of higher order into account, such as tertiary enhancement, or excitation by scattered radiation.
E. S. O. Box 25046, Denver Federal Center Denver, Colorado 80225 ABSTRACT SUPERXAP (Super X-ray Analysis Program) enables IBM-compatible personal computers to analyze energy-dispersive spectra using least-squares spectral deconvolution. The program corrects for instrument drift, background, peak overlap, and matrix effects. Pull down menus provide 24 subroutines and functions, that allow spectra to be transferred, stored, viewed, manipulated, and analyzed. Spectral peaks can be identified manually or automatically with color-coded K, L or M lines.
QUICK x2 = (c - n) -1 x c n (Fi -l: bj X Rij 2)/ Fi ] i=l j=l [l: (12) where Fi represents the counts in the ith channel of the unknown spectrum, bj is the contribution of the jth reference spectrum to the "unknown" spectrum, Rij is the counts in the ith channel of the jth reference spectrum, c is the number of channels, and n is the number of degrees of freedom. A perfect fit would yield a Chi-squared value of zero. A solution that is within the statistical limits of uncertainty for each channel would yield a chi-squared value of zero to one.